%0 Conference Paper %1 conf/icecsys/Bosio0V16 %A Bosio, Alberto %A Girard, Patrick %A Virazel, Arnaud %B ICECS %D 2016 %I IEEE %K dblp %P 524-527 %T Test of low power circuits: Issues and industrial practices. %U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2016.html#Bosio0V16 %@ 978-1-5090-6113-6

@inproceedings{conf/icecsys/Bosio0V16, added-at = {2017-05-23T00:00:00.000+0200}, author = {Bosio, Alberto and Girard, Patrick and Virazel, Arnaud}, biburl = {https://www.bibsonomy.org/bibtex/2c9945ae89c2617e2ea323249fa36f26b/dblp}, booktitle = {ICECS}, crossref = {conf/icecsys/2016}, ee = {https://doi.org/10.1109/ICECS.2016.7841254}, interhash = {01396d6719b494e536764c5aec3ed4a2}, intrahash = {c9945ae89c2617e2ea323249fa36f26b}, isbn = {978-1-5090-6113-6}, keywords = {dblp}, pages = {524-527}, publisher = {IEEE}, timestamp = {2019-10-17T19:54:04.000+0200}, title = {Test of low power circuits: Issues and industrial practices.}, url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2016.html#Bosio0V16}, year = 2016 }