Bitte melden Sie sich an um selbst Rezensionen oder Kommentare zu erstellen.
Zitieren Sie diese Publikation
Mehr Zitationsstile
- bitte auswählen -
%0 Journal Article
%1 journals/mr/WangCNZZSKZ16
%A Wang, You
%A Cai, Hao
%A Naviner, Lirida A. B.
%A Zhao, Xiaoxuan
%A Zhang, Yue
%A Slimani, Mariem
%A Klein, Jacques-Olivier
%A Zhao, Weisheng
%D 2016
%J Microelectron. Reliab.
%K dblp
%P 26-30
%T A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI.
%U http://dblp.uni-trier.de/db/journals/mr/mr64.html#WangCNZZSKZ16
%V 64
@article{journals/mr/WangCNZZSKZ16,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Wang, You and Cai, Hao and Naviner, Lirida A. B. and Zhao, Xiaoxuan and Zhang, Yue and Slimani, Mariem and Klein, Jacques-Olivier and Zhao, Weisheng},
biburl = {https://www.bibsonomy.org/bibtex/2fd923dadc3b58e765c3711d3d8a98ac9/dblp},
ee = {https://doi.org/10.1016/j.microrel.2016.07.073},
interhash = {038e414ec1f4c1ddcfd53bf582fb4330},
intrahash = {fd923dadc3b58e765c3711d3d8a98ac9},
journal = {Microelectron. Reliab.},
keywords = {dblp},
pages = {26-30},
timestamp = {2024-05-13T07:47:56.000+0200},
title = {A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#WangCNZZSKZ16},
volume = 64,
year = 2016
}