%0 Journal Article %1 journals/mr/PhulpinTITGA15 %A Phulpin, Tanguy %A Trémouilles, David %A Isoird, Karine %A Tournier, Dominique %A Godignon, Philippe %A Austin, Patrick %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1542-1548 %T Failure analysis of ESD-stressed SiC MESFET. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#PhulpinTITGA15 %V 55

@article{journals/mr/PhulpinTITGA15, added-at = {2023-09-30T00:00:00.000+0200}, author = {Phulpin, Tanguy and Trémouilles, David and Isoird, Karine and Tournier, Dominique and Godignon, Philippe and Austin, Patrick}, biburl = {https://www.bibsonomy.org/bibtex/29a12b1490f4efa1d07674d1ac181f66e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.121}, interhash = {050d2c3ef7d7cbac1cbaeae6593588ed}, intrahash = {9a12b1490f4efa1d07674d1ac181f66e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1542-1548}, timestamp = {2024-04-09T02:48:59.000+0200}, title = {Failure analysis of ESD-stressed SiC MESFET.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#PhulpinTITGA15}, volume = 55, year = 2015 }