%0 Conference Paper %1 conf/ats/ChenRRP09 %A Chen, Gang %A Rajski, Janusz %A Reddy, Sudhakar M. %A Pomeranz, Irith %B Asian Test Symposium %D 2009 %I IEEE Computer Society %K dblp %P 183-186 %T N-distinguishing Tests for Enhanced Defect Diagnosis. %U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#ChenRRP09 %@ 978-0-7695-3864-8

@inproceedings{conf/ats/ChenRRP09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chen, Gang and Rajski, Janusz and Reddy, Sudhakar M. and Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/206d32ea38adabc34fca6fc47adf40f87/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.47}, interhash = {092418225a7e6b7ca71cdb4be526880f}, intrahash = {06d32ea38adabc34fca6fc47adf40f87}, isbn = {978-0-7695-3864-8}, keywords = {dblp}, pages = {183-186}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:09.000+0200}, title = {N-distinguishing Tests for Enhanced Defect Diagnosis.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#ChenRRP09}, year = 2009 }