Inproceedings,
Analysis of short defects in FinFET based logic cells.
F. Forero, J. Gallière, M. Renovell, and V. Champac.LATS, page 1-6. IEEE, (2017)
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- BibTeX key
- conf/latw/ForeroGRC17
- entry type
- inproceedings
- booktitle
- LATS
- year
- 2017
- pages
- 1-6
- publisher
- IEEE
- crossref
- conf/latw/2017
- ee
- https://doi.org/10.1109/LATW.2017.7906755
- isbn
- 978-1-5386-0415-1
- url
- http://dblp.uni-trier.de/db/conf/latw/lats2017.html#ForeroGRC17
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- please select -%0 Conference Paper
%1 conf/latw/ForeroGRC17
%A Forero, Freddy
%A Gallière, Jean-Marc
%A Renovell, Michel
%A Champac, Víctor H.
%B LATS
%D 2017
%I IEEE
%K dblp
%P 1-6
%T Analysis of short defects in FinFET based logic cells.
%U http://dblp.uni-trier.de/db/conf/latw/lats2017.html#ForeroGRC17
%@ 978-1-5386-0415-1
@inproceedings{conf/latw/ForeroGRC17,
added-at = {2024-04-19T00:00:00.000+0200},
author = {Forero, Freddy and Gallière, Jean-Marc and Renovell, Michel and Champac, Víctor H.},
biburl = {https://www.bibsonomy.org/bibtex/21b9798cbd056798485ceb852a6f7bcb8/dblp},
booktitle = {LATS},
crossref = {conf/latw/2017},
ee = {https://doi.org/10.1109/LATW.2017.7906755},
interhash = {0925e2c4ffe48f5a353fb7c5291bba37},
intrahash = {1b9798cbd056798485ceb852a6f7bcb8},
isbn = {978-1-5386-0415-1},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-22T07:42:55.000+0200},
title = {Analysis of short defects in FinFET based logic cells.},
url = {http://dblp.uni-trier.de/db/conf/latw/lats2017.html#ForeroGRC17},
year = 2017
}