%0 Conference Paper %1 conf/itc/VoorakaranamNCCKMC03 %A Voorakaranam, Ramakrishna %A Newby, Randy %A Cherubal, Sasikumar %A Cometta, Bob %A Kuehl, Thomas %A Majernik, David M. %A Chatterjee, Abhijit %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 1174-1181 %T Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#VoorakaranamNCCKMC03 %@ 0-7803-8106-8

@inproceedings{conf/itc/VoorakaranamNCCKMC03, added-at = {2023-03-23T00:00:00.000+0100}, author = {Voorakaranam, Ramakrishna and Newby, Randy and Cherubal, Sasikumar and Cometta, Bob and Kuehl, Thomas and Majernik, David M. and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/2285700c5bbbe39428018995f2654a61d/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271106}, interhash = {099e7febb4912cb290aa201ea91093c5}, intrahash = {285700c5bbbe39428018995f2654a61d}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {1174-1181}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#VoorakaranamNCCKMC03}, year = 2003 }