%0 Conference Paper %1 conf/iecon/WangYR20 %A Wang, Jun %A Yuan, Xibo %A Rasekh, Navid %B IECON %D 2020 %I IEEE %K dblp %P 4717-4724 %T Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices. %U http://dblp.uni-trier.de/db/conf/iecon/iecon2020.html#WangYR20 %@ 978-1-7281-5414-5

@inproceedings{conf/iecon/WangYR20, added-at = {2021-12-22T00:00:00.000+0100}, author = {Wang, Jun and Yuan, Xibo and Rasekh, Navid}, biburl = {https://www.bibsonomy.org/bibtex/2ff86d31fe8eb693ba1e1f985bd355cec/dblp}, booktitle = {IECON}, crossref = {conf/iecon/2020}, ee = {https://doi.org/10.1109/IECON43393.2020.9255039}, interhash = {0afc0f432a3df59af7be7d081cbe30fc}, intrahash = {ff86d31fe8eb693ba1e1f985bd355cec}, isbn = {978-1-7281-5414-5}, keywords = {dblp}, pages = {4717-4724}, publisher = {IEEE}, timestamp = {2024-04-10T03:19:37.000+0200}, title = {Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices.}, url = {http://dblp.uni-trier.de/db/conf/iecon/iecon2020.html#WangYR20}, year = 2020 }