%0 Journal Article %1 journals/mr/HeerDBBPGDSG05 %A Heer, Michael %A Dubec, Viktor %A Blaho, M. %A Bychikhin, Sergey %A Pogany, Dionyz %A Gornik, Erich %A Denison, Marie %A Stecher, Matthias %A Groos, Gerhard %D 2005 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1688-1693 %T Automated setup for thermal imaging and electrical degradation study of power DMOS devices. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#HeerDBBPGDSG05 %V 45

@article{journals/mr/HeerDBBPGDSG05, added-at = {2022-03-16T00:00:00.000+0100}, author = {Heer, Michael and Dubec, Viktor and Blaho, M. and Bychikhin, Sergey and Pogany, Dionyz and Gornik, Erich and Denison, Marie and Stecher, Matthias and Groos, Gerhard}, biburl = {https://www.bibsonomy.org/bibtex/21e86b3b5020c40bc691caafdc0942b80/dblp}, ee = {https://www.wikidata.org/entity/Q110626918}, interhash = {0dd0b3fe01739b1d788533206f9004cb}, intrahash = {1e86b3b5020c40bc691caafdc0942b80}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1688-1693}, timestamp = {2024-04-09T02:49:20.000+0200}, title = {Automated setup for thermal imaging and electrical degradation study of power DMOS devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#HeerDBBPGDSG05}, volume = 45, year = 2005 }