%0 Journal Article %1 journals/tcad/KunduRJ91 %A Kundu, Sandip %A Reddy, Sudhakar M. %A Jha, Niraj K. %D 1991 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 8 %P 1036-1048 %T Design of robustly testable combinational logic circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad10.html#KunduRJ91 %V 10

@article{journals/tcad/KunduRJ91, added-at = {2020-09-24T00:00:00.000+0200}, author = {Kundu, Sandip and Reddy, Sudhakar M. and Jha, Niraj K.}, biburl = {https://www.bibsonomy.org/bibtex/24c4f9eddef24c480d0b582b29d111089/dblp}, ee = {https://doi.org/10.1109/43.85740}, interhash = {0e5b2fda95a4f0dbae09491a677ebb46}, intrahash = {4c4f9eddef24c480d0b582b29d111089}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 8, pages = {1036-1048}, timestamp = {2020-09-25T11:50:13.000+0200}, title = {Design of robustly testable combinational logic circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad10.html#KunduRJ91}, volume = 10, year = 1991 }