%0 Journal Article %1 journals/mr/JenkinsL13 %A Jenkins, Keith A. %A Lu, Pong-Fei %D 2013 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1252-1256 %T On-chip circuit to monitor long-term NBTI and PBTI degradation. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#JenkinsL13 %V 53

@article{journals/mr/JenkinsL13, added-at = {2020-02-22T00:00:00.000+0100}, author = {Jenkins, Keith A. and Lu, Pong-Fei}, biburl = {https://www.bibsonomy.org/bibtex/20258aae95f782c44cdd611faa98229c0/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.07.039}, interhash = {1009d3be33a4f4a74312fbdaaa2ddd07}, intrahash = {0258aae95f782c44cdd611faa98229c0}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1252-1256}, timestamp = {2020-02-25T13:25:08.000+0100}, title = {On-chip circuit to monitor long-term NBTI and PBTI degradation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#JenkinsL13}, volume = 53, year = 2013 }