%0 Journal Article %1 journals/mr/AhmedSCCJ12 %A Ahmed, Ashraf %A Shadrokh, Yasaman %A Coulbeck, Lee %A Castellazzi, Alberto %A Johnson, C. Mark %D 2012 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2358-2362 %T A closed-loop IGBT non-destructive tester. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#AhmedSCCJ12 %V 52

@article{journals/mr/AhmedSCCJ12, added-at = {2022-02-04T00:00:00.000+0100}, author = {Ahmed, Ashraf and Shadrokh, Yasaman and Coulbeck, Lee and Castellazzi, Alberto and Johnson, C. Mark}, biburl = {https://www.bibsonomy.org/bibtex/2c7a787b0dc60f9cfb8f57f1f7304b119/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.06.108}, interhash = {01984fea14e2fb06c6408e2532b89ed4}, intrahash = {c7a787b0dc60f9cfb8f57f1f7304b119}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2358-2362}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {A closed-loop IGBT non-destructive tester.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#AhmedSCCJ12}, volume = 52, year = 2012 }