%0 Journal Article %1 journals/tc/MetraFM04 %A Metra, Cecilia %A Francescantonio, Stefano Di %A Mak, T. M. %D 2004 %J IEEE Trans. Computers %K dblp %N 5 %P 531-546 %T Implications of Clock Distribution Faults and Issues with Screening Them during Manufacturing Testing. %U http://dblp.uni-trier.de/db/journals/tc/tc53.html#MetraFM04 %V 53

@article{journals/tc/MetraFM04, added-at = {2015-12-22T00:00:00.000+0100}, author = {Metra, Cecilia and Francescantonio, Stefano Di and Mak, T. M.}, biburl = {https://www.bibsonomy.org/bibtex/2e3db3ffbd13de4e186a06510d1387f73/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.2004.1275295}, interhash = {021ecc02e78605c8d119600901ec7b5c}, intrahash = {e3db3ffbd13de4e186a06510d1387f73}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 5, pages = {531-546}, timestamp = {2015-12-24T12:09:43.000+0100}, title = {Implications of Clock Distribution Faults and Issues with Screening Them during Manufacturing Testing.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc53.html#MetraFM04}, volume = 53, year = 2004 }