%0 Conference Paper %1 conf/icicdt/KameiTEO14 %A Kamei, Masayuki %A Takao, Yoshinori %A Eriguchi, Koji %A Ono, Kouichi %B ICICDT %D 2014 %I IEEE %K dblp %P 1-4 %T Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs. %U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2014.html#KameiTEO14 %@ 978-1-4799-2153-9

@inproceedings{conf/icicdt/KameiTEO14, added-at = {2016-05-17T00:00:00.000+0200}, author = {Kamei, Masayuki and Takao, Yoshinori and Eriguchi, Koji and Ono, Kouichi}, biburl = {https://www.bibsonomy.org/bibtex/21ee8a9786052d692b19032685b0c6c4e/dblp}, booktitle = {ICICDT}, crossref = {conf/icicdt/2014}, ee = {http://dx.doi.org/10.1109/ICICDT.2014.6838598}, interhash = {02f7cbc24e6e782ad4f427cd14d57a24}, intrahash = {1ee8a9786052d692b19032685b0c6c4e}, isbn = {978-1-4799-2153-9}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2016-05-19T11:47:55.000+0200}, title = {Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2014.html#KameiTEO14}, year = 2014 }