%0 Journal Article %1 journals/tie/LiTCTLLGHW19 %A Li, Kongjing %A Tian, Gui Yun %A Chen, Xiaotian %A Tang, Chaoqing %A Luo, Haoze %A Li, Wuhua %A Gao, Bin %A He, Xiangning %A Wright, Nick %D 2019 %J IEEE Trans. Ind. Electron. %K dblp %N 10 %P 8197-8204 %T AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. %U http://dblp.uni-trier.de/db/journals/tie/tie66.html#LiTCTLLGHW19 %V 66

@article{journals/tie/LiTCTLLGHW19, added-at = {2020-05-27T00:00:00.000+0200}, author = {Li, Kongjing and Tian, Gui Yun and Chen, Xiaotian and Tang, Chaoqing and Luo, Haoze and Li, Wuhua and Gao, Bin and He, Xiangning and Wright, Nick}, biburl = {https://www.bibsonomy.org/bibtex/208fc7ef80771b0187d95408ccbfb7817/dblp}, ee = {https://doi.org/10.1109/TIE.2018.2886775}, interhash = {0317a4fd95b703e3f42cb28818ed00b4}, intrahash = {08fc7ef80771b0187d95408ccbfb7817}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 10, pages = {8197-8204}, timestamp = {2020-05-28T11:38:34.000+0200}, title = {AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie66.html#LiTCTLLGHW19}, volume = 66, year = 2019 }