%0 Journal Article %1 journals/et/MartinsMCVP17 %A Martins, M. Tulio %A Medeiros, G. Cardoso %A Copetti, Thiago %A Vargas, Fabian %A Pohls, Marcus %D 2017 %J J. Electron. Test. %K dblp %N 5 %P 637-655 %T Analysing NBTI Impact on SRAMs with Resistive Defects. %U http://dblp.uni-trier.de/db/journals/et/et33.html#MartinsMCVP17 %V 33

@article{journals/et/MartinsMCVP17, added-at = {2021-09-03T00:00:00.000+0200}, author = {Martins, M. Tulio and Medeiros, G. Cardoso and Copetti, Thiago and Vargas, Fabian and Pohls, Marcus}, biburl = {https://www.bibsonomy.org/bibtex/27cdb5bda6bc60e20059ab8c310d54b39/dblp}, ee = {https://doi.org/10.1007/s10836-017-5685-6}, interhash = {03c60ee6cd74be8a0d1cc77f39c222ac}, intrahash = {7cdb5bda6bc60e20059ab8c310d54b39}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 5, pages = {637-655}, timestamp = {2024-04-08T20:52:34.000+0200}, title = {Analysing NBTI Impact on SRAMs with Resistive Defects.}, url = {http://dblp.uni-trier.de/db/journals/et/et33.html#MartinsMCVP17}, volume = 33, year = 2017 }