%0 Journal Article %1 journals/tim/BiswasDP14 %A Biswas, Satyendra N. %A Das, Sunil R. %A Petriu, Emil M. %D 2014 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 11 %P 2611-2619 %T On System-on-Chip Testing Using Hybrid Test Vector Compression. %U http://dblp.uni-trier.de/db/journals/tim/tim63.html#BiswasDP14 %V 63

@article{journals/tim/BiswasDP14, added-at = {2016-03-09T00:00:00.000+0100}, author = {Biswas, Satyendra N. and Das, Sunil R. and Petriu, Emil M.}, biburl = {https://www.bibsonomy.org/bibtex/2c52db99f6b1e9051eca415736b857ff7/dblp}, ee = {http://dx.doi.org/10.1109/TIM.2014.2313431}, interhash = {04d412ba61afcf92d5b29d4d29f6bf19}, intrahash = {c52db99f6b1e9051eca415736b857ff7}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 11, pages = {2611-2619}, timestamp = {2016-03-10T18:42:13.000+0100}, title = {On System-on-Chip Testing Using Hybrid Test Vector Compression.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim63.html#BiswasDP14}, volume = 63, year = 2014 }