%0 Journal Article %1 journals/mr/WatanabeTO13 %A Watanabe, Akihiko %A Tsukuda, Masanori %A Omura, Ichiro %D 2013 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1692-1696 %T Real time degradation monitoring system for high power IGBT module under power cycling test. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#WatanabeTO13 %V 53

@article{journals/mr/WatanabeTO13, added-at = {2020-02-22T00:00:00.000+0100}, author = {Watanabe, Akihiko and Tsukuda, Masanori and Omura, Ichiro}, biburl = {https://www.bibsonomy.org/bibtex/2c297e81f09ce548020c85c9e3077b064/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.07.084}, interhash = {082d11ef450ef7d7d10167a696110afe}, intrahash = {c297e81f09ce548020c85c9e3077b064}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1692-1696}, timestamp = {2020-02-25T13:30:23.000+0100}, title = {Real time degradation monitoring system for high power IGBT module under power cycling test.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#WatanabeTO13}, volume = 53, year = 2013 }