Inproceedings,
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.
T. Uemura, B. Chung, J. Kim, H. Shim, S. Chung, B. Lee, J. Choi, S. Ohnishi, and K. Machida.IRPS, page 7. IEEE, (2022)
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- conf/irps/UemuraCKSCLCOM22
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2022
- pages
- 7
- publisher
- IEEE
- crossref
- conf/irps/2022
- ee
- https://doi.org/10.1109/IRPS48227.2022.9764581
- isbn
- 978-1-6654-7950-9
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2022.html#UemuraCKSCLCOM22
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%1 conf/irps/UemuraCKSCLCOM22
%A Uemura, Taiki
%A Chung, Byungjin
%A Kim, Jegon
%A Shim, Hyewon
%A Chung, Shin-Young
%A Lee, Brandon
%A Choi, Jaehee
%A Ohnishi, Shota
%A Machida, Ken
%B IRPS
%D 2022
%I IEEE
%K dblp
%P 7
%T Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.
%U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#UemuraCKSCLCOM22
%@ 978-1-6654-7950-9
@inproceedings{conf/irps/UemuraCKSCLCOM22,
added-at = {2022-05-09T00:00:00.000+0200},
author = {Uemura, Taiki and Chung, Byungjin and Kim, Jegon and Shim, Hyewon and Chung, Shin-Young and Lee, Brandon and Choi, Jaehee and Ohnishi, Shota and Machida, Ken},
biburl = {https://www.bibsonomy.org/bibtex/2d73d9d65a1c97794c0372a1a630767ff/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2022},
ee = {https://doi.org/10.1109/IRPS48227.2022.9764581},
interhash = {098d4fbe4abec1988e79b37ed4712830},
intrahash = {d73d9d65a1c97794c0372a1a630767ff},
isbn = {978-1-6654-7950-9},
keywords = {dblp},
pages = 7,
publisher = {IEEE},
timestamp = {2024-04-09T12:18:58.000+0200},
title = {Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#UemuraCKSCLCOM22},
year = 2022
}