%0 Conference Paper %1 conf/itc/KuC91 %A Ku, Tsu-Wei %A Chia, Wei-Kong %B ITC %D 1991 %I IEEE Computer Society %K dblp %P 83-87 %T A Sequential Test Generator with Explicit Elimination of Easy-to-Test Faults. %U http://dblp.uni-trier.de/db/conf/itc/itc1991.html#KuC91 %@ 0-8186-9156-5

@inproceedings{conf/itc/KuC91, added-at = {2023-03-23T00:00:00.000+0100}, author = {Ku, Tsu-Wei and Chia, Wei-Kong}, biburl = {https://www.bibsonomy.org/bibtex/2667fd485007919ca4bf9c6981042fb99/dblp}, booktitle = {ITC}, crossref = {conf/itc/1991}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1991.519497}, interhash = {0a4cec7842d15ed393b6ba4cf2bc63f6}, intrahash = {667fd485007919ca4bf9c6981042fb99}, isbn = {0-8186-9156-5}, keywords = {dblp}, pages = {83-87}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:51.000+0200}, title = {A Sequential Test Generator with Explicit Elimination of Easy-to-Test Faults.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1991.html#KuC91}, year = 1991 }