%0 Conference Paper %1 conf/itc/KooRT89 %A Koo, Kenrick %A Ramseyer, Steve %A Tejeda, Al %B ITC %D 1989 %I IEEE Computer Society %K dblp %P 452-460 %T A Testing Methodology for New-Generation Specialty Memory Devices. %U http://dblp.uni-trier.de/db/conf/itc/itc1989.html#KooRT89

@inproceedings{conf/itc/KooRT89, added-at = {2023-03-23T00:00:00.000+0100}, author = {Koo, Kenrick and Ramseyer, Steve and Tejeda, Al}, biburl = {https://www.bibsonomy.org/bibtex/2a34b3a9f7fc8f5d9671d4929079275cd/dblp}, booktitle = {ITC}, crossref = {conf/itc/1989}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1989.82328}, interhash = {0d2f83592cc9ef927a2cfba56d4c4c7f}, intrahash = {a34b3a9f7fc8f5d9671d4929079275cd}, keywords = {dblp}, pages = {452-460}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:51:49.000+0200}, title = {A Testing Methodology for New-Generation Specialty Memory Devices.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1989.html#KooRT89}, year = 1989 }