%0 Conference Paper %1 conf/itc/AmyeenKCNVJGS16 %A Amyeen, M. Enamul %A Kim, Dongok %A Chandrasekar, Maheshwar %A Noman, Mohammad %A Venkataraman, Srikanth %A Jain, Anurag %A Goel, Neha %A Sharma, Ramesh %B ITC %D 2016 %I IEEE %K %P 1-10 %T A novel diagnostic test generation methodology and its application in production failure isolation. %U http://dblp.uni-trier.de/db/conf/itc/itc2016.html#AmyeenKCNVJGS16 %@ 978-1-4673-8773-6

@inproceedings{conf/itc/AmyeenKCNVJGS16, added-at = {2023-12-12T18:20:25.000+0100}, author = {Amyeen, M. Enamul and Kim, Dongok and Chandrasekar, Maheshwar and Noman, Mohammad and Venkataraman, Srikanth and Jain, Anurag and Goel, Neha and Sharma, Ramesh}, biburl = {https://www.bibsonomy.org/bibtex/2474dcf6eb886743eb4c192350db81eb4/admin}, booktitle = {ITC}, crossref = {conf/itc/2016}, ee = {http://dx.doi.org/10.1109/TEST.2016.7805821}, interhash = {10de30339e236bd4e5784aa623002c1b}, intrahash = {474dcf6eb886743eb4c192350db81eb4}, isbn = {978-1-4673-8773-6}, keywords = {}, pages = {1-10}, publisher = {IEEE}, timestamp = {2023-12-12T18:20:25.000+0100}, title = {A novel diagnostic test generation methodology and its application in production failure isolation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2016.html#AmyeenKCNVJGS16}, year = 2016 }