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%0 Journal Article
%1 journals/tim/OttaviSWKML06
%A Ottavi, Marco
%A Schiano, Luca
%A Wang, Xiaopeng
%A Kim, Yong-Bin
%A Meyer, Fred J.
%A Lombardi, Fabrizio
%D 2006
%J IEEE Trans. Instrumentation and Measurement
%K
%N 5
%P 1704-1712
%T Evaluating the Yield of Repairable SRAMs for ATE.
%U http://dblp.uni-trier.de/db/journals/tim/tim55.html#OttaviSWKML06
%V 55
@article{journals/tim/OttaviSWKML06,
added-at = {2023-12-12T18:14:23.000+0100},
author = {Ottavi, Marco and Schiano, Luca and Wang, Xiaopeng and Kim, Yong-Bin and Meyer, Fred J. and Lombardi, Fabrizio},
biburl = {https://www.bibsonomy.org/bibtex/2c9c7eec6016d81e7c95ce8e5b354ec20/admin},
ee = {http://dx.doi.org/10.1109/TIM.2006.880315},
interhash = {0f6edc4cfe1f337390a624a01465fbeb},
intrahash = {c9c7eec6016d81e7c95ce8e5b354ec20},
journal = {IEEE Trans. Instrumentation and Measurement},
keywords = {},
number = 5,
pages = {1704-1712},
timestamp = {2023-12-12T18:14:23.000+0100},
title = {Evaluating the Yield of Repairable SRAMs for ATE.},
url = {http://dblp.uni-trier.de/db/journals/tim/tim55.html#OttaviSWKML06},
volume = 55,
year = 2006
}