%0 Journal Article %1 journals/mr/MarchutW08 %A Marchut, Leslie %A Whitman, Charles S. %D 2008 %J Microelectron. Reliab. %K dblp %N 7 %P 990-993 %T Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#MarchutW08 %V 48

@article{journals/mr/MarchutW08, added-at = {2020-02-22T00:00:00.000+0100}, author = {Marchut, Leslie and Whitman, Charles S.}, biburl = {https://www.bibsonomy.org/bibtex/293f7f3a14fbea2cacf7d9c7ba96b1485/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.03.004}, interhash = {10219204d6713336825570d1af967b83}, intrahash = {93f7f3a14fbea2cacf7d9c7ba96b1485}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 7, pages = {990-993}, timestamp = {2020-02-25T13:23:17.000+0100}, title = {Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#MarchutW08}, volume = 48, year = 2008 }