%0 Conference Paper %1 conf/ats/BaduraH97 %A Badura, Dariusz %A Hlawiczka, Andrzej %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 410-415 %T Low Cost Bist for Edac Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#BaduraH97 %@ 0-8186-8209-4

@inproceedings{conf/ats/BaduraH97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Badura, Dariusz and Hlawiczka, Andrzej}, biburl = {https://www.bibsonomy.org/bibtex/21205ccde4abab30e03518ef97be6d5cd/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643991}, interhash = {11c332adae6ec515f250950465223b58}, intrahash = {1205ccde4abab30e03518ef97be6d5cd}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {410-415}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {Low Cost Bist for Edac Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#BaduraH97}, year = 1997 }