%0 Journal Article %1 journals/ieiceee/YoshikawaISMI20 %A Yoshikawa, Takefumi %A Iwata, Tatsuya %A Shibazaki, Junji %A Muroga, Sho %A Ikeda, Hiroaki %D 2020 %J IEICE Electron. Express %K dblp %N 10 %P 20200112 %T A charge recycling stacked I/O in standard CMOS technology for wide TSV data bus. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee17.html#YoshikawaISMI20 %V 17

@article{journals/ieiceee/YoshikawaISMI20, added-at = {2023-09-30T00:00:00.000+0200}, author = {Yoshikawa, Takefumi and Iwata, Tatsuya and Shibazaki, Junji and Muroga, Sho and Ikeda, Hiroaki}, biburl = {https://www.bibsonomy.org/bibtex/25295a3c2aaef48b1487daf4f4cebc03f/dblp}, ee = {https://www.wikidata.org/entity/Q114594506}, interhash = {134c8790f2e46a8d038d48110b3e605e}, intrahash = {5295a3c2aaef48b1487daf4f4cebc03f}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 10, pages = 20200112, timestamp = {2024-04-09T06:50:32.000+0200}, title = {A charge recycling stacked I/O in standard CMOS technology for wide TSV data bus.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee17.html#YoshikawaISMI20}, volume = 17, year = 2020 }