%0 Journal Article %1 journals/mr/Abessolo-BidzoPDD05 %A Abessolo-Bidzo, Dolphin %A Poirier, Patrick %A Descamps, Philippe %A Domengès, Bernadette %D 2005 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1639-1644 %T Isolating failing sites in IC packages using time domain reflectometry: Case studies. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#Abessolo-BidzoPDD05 %V 45

@article{journals/mr/Abessolo-BidzoPDD05, added-at = {2023-09-28T00:00:00.000+0200}, author = {Abessolo-Bidzo, Dolphin and Poirier, Patrick and Descamps, Philippe and Domengès, Bernadette}, biburl = {https://www.bibsonomy.org/bibtex/2260a0ed55f5820650522de2bfb429d21/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.07.068}, interhash = {13b4b686db5a303e5bba186c64ff5ea7}, intrahash = {260a0ed55f5820650522de2bfb429d21}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1639-1644}, timestamp = {2024-04-09T02:49:59.000+0200}, title = {Isolating failing sites in IC packages using time domain reflectometry: Case studies.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#Abessolo-BidzoPDD05}, volume = 45, year = 2005 }