%0 Journal Article %1 journals/mr/HuardACP11 %A Huard, Vincent %A Amador, N. Ruiz %A Cacho, Florian %A Pion, E. %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1425-1439 %T A bottom-up approach for System-On-Chip reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#HuardACP11 %V 51

@article{journals/mr/HuardACP11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Huard, Vincent and Amador, N. Ruiz and Cacho, Florian and Pion, E.}, biburl = {https://www.bibsonomy.org/bibtex/2efd1869a623b26a17b8c5e44d28f9cc8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.07.086}, interhash = {1530304a9376f9d24356d2e7a5a177ab}, intrahash = {efd1869a623b26a17b8c5e44d28f9cc8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1425-1439}, timestamp = {2020-02-25T13:24:46.000+0100}, title = {A bottom-up approach for System-On-Chip reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#HuardACP11}, volume = 51, year = 2011 }