%0 Journal Article %1 journals/mr/LiCNCWLCKSGBWW18 %A Li, Yuanqing %A Chen, Li %A Nofal, Issam %A Chen, Mo %A Wang, Haibin %A Liu, Rui %A Chen, Qingyu %A Krstic, Milos %A Shi, Shuting %A Guo, Gang %A Baeg, Sang H. %A Wen, Shi-Jie %A Wong, Richard %D 2018 %J Microelectron. Reliab. %K dblp %P 24-32 %T Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. %U http://dblp.uni-trier.de/db/journals/mr/mr87.html#LiCNCWLCKSGBWW18 %V 87

@article{journals/mr/LiCNCWLCKSGBWW18, added-at = {2024-02-05T00:00:00.000+0100}, author = {Li, Yuanqing and Chen, Li and Nofal, Issam and Chen, Mo and Wang, Haibin and Liu, Rui and Chen, Qingyu and Krstic, Milos and Shi, Shuting and Guo, Gang and Baeg, Sang H. and Wen, Shi-Jie and Wong, Richard}, biburl = {https://www.bibsonomy.org/bibtex/2c3533dee020cf07c9e187c7372b82da8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.05.016}, interhash = {15bc8d23773e564c8760200d6adb7858}, intrahash = {c3533dee020cf07c9e187c7372b82da8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {24-32}, timestamp = {2024-04-09T02:50:06.000+0200}, title = {Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr87.html#LiCNCWLCKSGBWW18}, volume = 87, year = 2018 }