Inproceedings,
Accurate measurement of small delay defect coverage of test patterns.
N. Devta-Prasanna, S. Goel, A. Gunda, M. Ward, and P. Krishnamurthy.ITC, page 1-10. IEEE Computer Society, (2009)
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- conf/itc/Devta-PrasannaGGWK09
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- inproceedings
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- ITC
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- 2009
- pages
- 1-10
- publisher
- IEEE Computer Society
- crossref
- conf/itc/2009
- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.2009.5355644
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- 978-1-4244-4868-5
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- http://dblp.uni-trier.de/db/conf/itc/itc2009.html#Devta-PrasannaGGWK09
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%1 conf/itc/Devta-PrasannaGGWK09
%A Devta-Prasanna, Narendra
%A Goel, Sandeep Kumar
%A Gunda, Arun
%A Ward, Mark
%A Krishnamurthy, P.
%B ITC
%D 2009
%E Roberts, Gordon W.
%E Eklow, Bill
%I IEEE Computer Society
%K dblp
%P 1-10
%T Accurate measurement of small delay defect coverage of test patterns.
%U http://dblp.uni-trier.de/db/conf/itc/itc2009.html#Devta-PrasannaGGWK09
%@ 978-1-4244-4868-5
@inproceedings{conf/itc/Devta-PrasannaGGWK09,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Devta-Prasanna, Narendra and Goel, Sandeep Kumar and Gunda, Arun and Ward, Mark and Krishnamurthy, P.},
biburl = {https://www.bibsonomy.org/bibtex/2832a02aec96d7400ab5c940278009484/dblp},
booktitle = {ITC},
crossref = {conf/itc/2009},
editor = {Roberts, Gordon W. and Eklow, Bill},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2009.5355644},
interhash = {174a77f78fc0beea768d83d504dd1ab1},
intrahash = {832a02aec96d7400ab5c940278009484},
isbn = {978-1-4244-4868-5},
keywords = {dblp},
pages = {1-10},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:29:19.000+0200},
title = {Accurate measurement of small delay defect coverage of test patterns.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2009.html#Devta-PrasannaGGWK09},
year = 2009
}