%0 Conference Paper %1 conf/itc/Maxwell02a %A Maxwell, Peter C. %B ITC %D 2002 %I IEEE Computer Society %K dblp %P 1050-1055 %T Wafer/Package Test Mix for Optimal Defect Detection. %U http://dblp.uni-trier.de/db/conf/itc/itc2002.html#Maxwell02a %@ 0-7803-7543-2

@inproceedings{conf/itc/Maxwell02a, added-at = {2023-03-23T00:00:00.000+0100}, author = {Maxwell, Peter C.}, biburl = {https://www.bibsonomy.org/bibtex/2303b93c2bbb1fc437ded863f84d933dd/dblp}, booktitle = {ITC}, crossref = {conf/itc/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041861}, interhash = {17a4ce72ecc56300fb11a74a7877c19c}, intrahash = {303b93c2bbb1fc437ded863f84d933dd}, isbn = {0-7803-7543-2}, keywords = {dblp}, pages = {1050-1055}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:16.000+0200}, title = {Wafer/Package Test Mix for Optimal Defect Detection.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#Maxwell02a}, year = 2002 }