%0 Journal Article %1 journals/tim/ZjajoAG12 %A Zjajo, Amir %A Asian, Manuel J. Barragan %A de Gyvez, José Pineda %D 2012 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 8 %P 2212-2221 %T Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS. %U http://dblp.uni-trier.de/db/journals/tim/tim61.html#ZjajoAG12 %V 61

@article{journals/tim/ZjajoAG12, added-at = {2016-03-09T00:00:00.000+0100}, author = {Zjajo, Amir and Asian, Manuel J. Barragan and de Gyvez, José Pineda}, biburl = {https://www.bibsonomy.org/bibtex/2378c3d224c1194cb74ca09cfc317b23e/dblp}, ee = {http://dx.doi.org/10.1109/TIM.2012.2184195}, interhash = {17a6d7d1a61cb5bd48f8415b2425bfc6}, intrahash = {378c3d224c1194cb74ca09cfc317b23e}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 8, pages = {2212-2221}, timestamp = {2016-03-10T18:36:28.000+0100}, title = {Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim61.html#ZjajoAG12}, volume = 61, year = 2012 }