%0 Journal Article %1 journals/tie/SuLC99 %A Su, Mu-Chun %A Liu, Chih-Wen %A Chang, Chen-Sung %D 1999 %J IEEE Trans. Ind. Electron. %K dblp %N 6 %P 1114-1122 %T Rule extraction for voltage security margin estimation. %U http://dblp.uni-trier.de/db/journals/tie/tie46.html#SuLC99 %V 46

@article{journals/tie/SuLC99, added-at = {2020-05-22T00:00:00.000+0200}, author = {Su, Mu-Chun and Liu, Chih-Wen and Chang, Chen-Sung}, biburl = {https://www.bibsonomy.org/bibtex/22f72079f62f42584acb2483bf8679fac/dblp}, ee = {https://doi.org/10.1109/41.807998}, interhash = {18a72e1d8b5422b29d0d8144e255d72c}, intrahash = {2f72079f62f42584acb2483bf8679fac}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 6, pages = {1114-1122}, timestamp = {2020-05-23T11:49:03.000+0200}, title = {Rule extraction for voltage security margin estimation.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie46.html#SuLC99}, volume = 46, year = 1999 }