%0 Journal Article %1 journals/mam/RavikumarSA99 %A Ravikumar, C. P. %A Saund, Gurjeet S. %A Agrawal, Nidhi %D 1999 %J Microprocess. Microsystems %K dblp %N 9 %P 535-542 %T A functional-level testability measure for register-level circuits and its estimation. %U http://dblp.uni-trier.de/db/journals/mam/mam22.html#RavikumarSA99 %V 22

@article{journals/mam/RavikumarSA99, added-at = {2020-02-22T00:00:00.000+0100}, author = {Ravikumar, C. P. and Saund, Gurjeet S. and Agrawal, Nidhi}, biburl = {https://www.bibsonomy.org/bibtex/210e191d38314b3c48342d7d2994cb413/dblp}, ee = {https://doi.org/10.1016/S0141-9331(98)00111-2}, interhash = {1a86ce6e496de19211716f1dad026e10}, intrahash = {10e191d38314b3c48342d7d2994cb413}, journal = {Microprocess. Microsystems}, keywords = {dblp}, number = 9, pages = {535-542}, timestamp = {2020-02-25T12:53:43.000+0100}, title = {A functional-level testability measure for register-level circuits and its estimation.}, url = {http://dblp.uni-trier.de/db/journals/mam/mam22.html#RavikumarSA99}, volume = 22, year = 1999 }