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%0 Journal Article
%1 yoon:3976
%A Yoon, C. S.
%A Lee, J. H.
%A Jeong, H. D.
%A Kim, C. K.
%A Yuh, J. H.
%A Haasch, Rick
%D 2002
%I AIP
%J Applied Physics Letters
%K diffusion
%N 21
%P 3976-3978
%R 10.1063/1.1481185
%T Diffusion study of the exchange-biased NiFe/MnIr/CoFe electrode in magnetic tunnel junctions
%U http://link.aip.org/link/?APL/80/3976/1
%V 80
@article{yoon:3976,
added-at = {2008-07-01T12:20:04.000+0200},
author = {Yoon, C. S. and Lee, J. H. and Jeong, H. D. and Kim, C. K. and Yuh, J. H. and Haasch, Rick},
biburl = {https://www.bibsonomy.org/bibtex/2205250cf6dbab90405a9e0b6cbc183ee/srd27},
doi = {10.1063/1.1481185},
interhash = {1a9f643fd0e154f335b44b9db01c4076},
intrahash = {205250cf6dbab90405a9e0b6cbc183ee},
journal = {Applied Physics Letters},
keywords = {diffusion},
number = 21,
pages = {3976-3978},
publisher = {AIP},
timestamp = {2008-07-01T12:20:04.000+0200},
title = {Diffusion study of the exchange-biased NiFe/MnIr/CoFe electrode in magnetic tunnel junctions},
url = {http://link.aip.org/link/?APL/80/3976/1},
volume = 80,
year = 2002
}
