%0 Journal Article %1 journals/mr/ShenCSSTL16 %A Shen, Junjie %A Chen, Pengfei %A Su, Lei %A Shi, Tielin %A Tang, Zirong %A Liao, Guanglan %D 2016 %J Microelectron. Reliab. %K dblp %P 129-134 %T X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm. %U http://dblp.uni-trier.de/db/journals/mr/mr67.html#ShenCSSTL16 %V 67

@article{journals/mr/ShenCSSTL16, added-at = {2020-05-20T00:00:00.000+0200}, author = {Shen, Junjie and Chen, Pengfei and Su, Lei and Shi, Tielin and Tang, Zirong and Liao, Guanglan}, biburl = {https://www.bibsonomy.org/bibtex/24545e59ebb3dec8c7e8a303882f3d6d4/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.10.011}, interhash = {1c8671351f02f3d920a9ad931b722209}, intrahash = {4545e59ebb3dec8c7e8a303882f3d6d4}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {129-134}, timestamp = {2020-05-21T11:48:23.000+0200}, title = {X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr67.html#ShenCSSTL16}, volume = 67, year = 2016 }