%0 Conference Paper %1 conf/ifm/HoomanMW12 %A Hooman, Jozef %A Mooij, Arjan J. %A van Wezep, Hans %B IFM %D 2012 %E Derrick, John %E Gnesi, Stefania %E Latella, Diego %E Treharne, Helen %I Springer %K dblp %P 268-282 %T Early Fault Detection in Industry Using Models at Various Abstraction Levels. %U http://dblp.uni-trier.de/db/conf/ifm/ifm2012.html#HoomanMW12 %V 7321 %@ 978-3-642-30728-7

@inproceedings{conf/ifm/HoomanMW12, added-at = {2017-05-24T00:00:00.000+0200}, author = {Hooman, Jozef and Mooij, Arjan J. and van Wezep, Hans}, biburl = {https://www.bibsonomy.org/bibtex/2abbf91b64f526685489f3388b0939b24/dblp}, booktitle = {IFM}, crossref = {conf/ifm/2012}, editor = {Derrick, John and Gnesi, Stefania and Latella, Diego and Treharne, Helen}, ee = {https://doi.org/10.1007/978-3-642-30729-4_19}, interhash = {1c898402d061a4b59cf07d6f726d7e3a}, intrahash = {abbf91b64f526685489f3388b0939b24}, isbn = {978-3-642-30728-7}, keywords = {dblp}, pages = {268-282}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2019-05-15T18:51:16.000+0200}, title = {Early Fault Detection in Industry Using Models at Various Abstraction Levels.}, url = {http://dblp.uni-trier.de/db/conf/ifm/ifm2012.html#HoomanMW12}, volume = 7321, year = 2012 }