%0 Conference Paper %1 conf/rait/SinghVCR16 %A Singh, Sandeep %A Verma, Aman %A Chatterjee, Subhashis %A Ramana, Venkata %B RAIT %D 2016 %I IEEE %K dblp %P 25-28 %T An efficient methodology to solve the K-terminal network reliability problem. %U http://dblp.uni-trier.de/db/conf/rait/rait2016.html#SinghVCR16 %@ 978-1-4799-8579-1

@inproceedings{conf/rait/SinghVCR16, added-at = {2020-03-10T00:00:00.000+0100}, author = {Singh, Sandeep and Verma, Aman and Chatterjee, Subhashis and Ramana, Venkata}, biburl = {https://www.bibsonomy.org/bibtex/268122c568283ef2261c35db5abfe757b/dblp}, booktitle = {RAIT}, crossref = {conf/rait/2016}, ee = {https://doi.org/10.1109/RAIT.2016.7507869}, interhash = {1f405c965f0d8d77d2cb4b8c47890fe1}, intrahash = {68122c568283ef2261c35db5abfe757b}, isbn = {978-1-4799-8579-1}, keywords = {dblp}, pages = {25-28}, publisher = {IEEE}, timestamp = {2020-03-11T12:18:44.000+0100}, title = {An efficient methodology to solve the K-terminal network reliability problem.}, url = {http://dblp.uni-trier.de/db/conf/rait/rait2016.html#SinghVCR16}, year = 2016 }