%0 Journal Article %1 journals/et/NavabiMLL04 %A Navabi, Zainalabedin %A Mirkhani, Shahrzad %A Lavasani, Meisam %A Lombardi, Fabrizio %D 2004 %J J. Electron. Test. %K dblp %N 6 %P 575-589 %T Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation. %U http://dblp.uni-trier.de/db/journals/et/et20.html#NavabiMLL04 %V 20

@article{journals/et/NavabiMLL04, added-at = {2020-09-11T00:00:00.000+0200}, author = {Navabi, Zainalabedin and Mirkhani, Shahrzad and Lavasani, Meisam and Lombardi, Fabrizio}, biburl = {https://www.bibsonomy.org/bibtex/27f60fbe44a7e59a741d898decf79df87/dblp}, ee = {https://doi.org/10.1007/s10677-004-4247-z}, interhash = {200b5dd8332947e5d63b0043f923ec52}, intrahash = {7f60fbe44a7e59a741d898decf79df87}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 6, pages = {575-589}, timestamp = {2020-09-12T11:40:48.000+0200}, title = {Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation.}, url = {http://dblp.uni-trier.de/db/journals/et/et20.html#NavabiMLL04}, volume = 20, year = 2004 }