%0 Journal Article %1 journals/tcad/DeyatiMC20 %A Deyati, Sabyasachi %A Muldrey, Barry J. %A Chatterjee, Abhijit %D 2020 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 10 %P 2006-2019 %T Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware. %U http://dblp.uni-trier.de/db/journals/tcad/tcad39.html#DeyatiMC20 %V 39

@article{journals/tcad/DeyatiMC20, added-at = {2020-10-06T00:00:00.000+0200}, author = {Deyati, Sabyasachi and Muldrey, Barry J. and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/2cb244c58f9d7ab46cdc0118609299af5/dblp}, ee = {https://doi.org/10.1109/TCAD.2019.2948902}, interhash = {215f37fbb2aa0cd117c67870dcad787f}, intrahash = {cb244c58f9d7ab46cdc0118609299af5}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 10, pages = {2006-2019}, timestamp = {2020-10-07T11:36:24.000+0200}, title = {Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad39.html#DeyatiMC20}, volume = 39, year = 2020 }