%0 Journal Article %1 journals/mr/BarliniCCMF06 %A Barlini, Davide %A Ciappa, Mauro %A Castellazzi, Alberto %A Mermet-Guyennet, Michel %A Fichtner, Wolfgang %D 2006 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1772-1777 %T New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#BarliniCCMF06 %V 46

@article{journals/mr/BarliniCCMF06, added-at = {2020-02-22T00:00:00.000+0100}, author = {Barlini, Davide and Ciappa, Mauro and Castellazzi, Alberto and Mermet-Guyennet, Michel and Fichtner, Wolfgang}, biburl = {https://www.bibsonomy.org/bibtex/2ce049699ee310a4bb16371ca9a9f2f45/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.07.058}, interhash = {223f9b153c45320fdc23ae0ad746152e}, intrahash = {ce049699ee310a4bb16371ca9a9f2f45}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1772-1777}, timestamp = {2020-02-25T13:23:10.000+0100}, title = {New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#BarliniCCMF06}, volume = 46, year = 2006 }