%0 Conference Paper %1 conf/edcc/NovakZP05 %A Novák, Ondrej %A Zahrádka, Jirí %A Plíva, Zdenek %B EDCC %D 2005 %E Cin, Mario Dal %E Kaâniche, Mohamed %E Pataricza, András %I Springer %K dblp %P 403-414 %T COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. %U http://dblp.uni-trier.de/db/conf/edcc/edcc2005.html#NovakZP05 %V 3463 %@ 3-540-25723-3

@inproceedings{conf/edcc/NovakZP05, added-at = {2017-05-26T00:00:00.000+0200}, author = {Novák, Ondrej and Zahrádka, Jirí and Plíva, Zdenek}, biburl = {https://www.bibsonomy.org/bibtex/211a87bd6fd6441d3700b916b6ef47e02/dblp}, booktitle = {EDCC}, crossref = {conf/edcc/2005}, editor = {Cin, Mario Dal and Kaâniche, Mohamed and Pataricza, András}, ee = {https://doi.org/10.1007/11408901_30}, interhash = {22a16bf6d0bf70c00a3d1c8e1b24a7e3}, intrahash = {11a87bd6fd6441d3700b916b6ef47e02}, isbn = {3-540-25723-3}, keywords = {dblp}, pages = {403-414}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2019-05-15T17:16:33.000+0200}, title = {COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits.}, url = {http://dblp.uni-trier.de/db/conf/edcc/edcc2005.html#NovakZP05}, volume = 3463, year = 2005 }