%0 Journal Article %1 journals/mr/CiminoCPG03 %A Cimino, S. %A Cester, Andrea %A Paccagnella, Alessandro %A Ghidini, G. %D 2003 %J Microelectron. Reliab. %K dblp %N 8 %P 1247-1251 %T Ionising radiation effects on MOSFET drain current. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#CiminoCPG03 %V 43

@article{journals/mr/CiminoCPG03, added-at = {2022-10-02T00:00:00.000+0200}, author = {Cimino, S. and Cester, Andrea and Paccagnella, Alessandro and Ghidini, G.}, biburl = {https://www.bibsonomy.org/bibtex/254f629ac034200bc526ccc3ff3b7de7f/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00179-3}, interhash = {122bf96c5d8125810e07f3626c000ae6}, intrahash = {54f629ac034200bc526ccc3ff3b7de7f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1247-1251}, timestamp = {2024-04-09T02:49:51.000+0200}, title = {Ionising radiation effects on MOSFET drain current.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#CiminoCPG03}, volume = 43, year = 2003 }