%0 Conference Paper %1 conf/itc/SWangG99 %A Wang, Seongmoon %A Gupta, Sandeep K. %B ITC %D 1999 %I IEEE Computer Society %K dblp %P 85-94 %T LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. %U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#SWangG99 %@ 0-7803-5753-1

@inproceedings{conf/itc/SWangG99, added-at = {2023-09-22T00:00:00.000+0200}, author = {Wang, Seongmoon and Gupta, Sandeep K.}, biburl = {https://www.bibsonomy.org/bibtex/2d0058434edb06287480b775dcac7426a/dblp}, booktitle = {ITC}, crossref = {conf/itc/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805617}, interhash = {22f31b4de1a809aa14da48cfc226fdef}, intrahash = {d0058434edb06287480b775dcac7426a}, isbn = {0-7803-5753-1}, keywords = {dblp}, pages = {85-94}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:23.000+0200}, title = {LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#SWangG99}, year = 1999 }