%0 Journal Article %1 journals/mr/SchlunderPRGR18 %A Schlünder, Christian %A Puschkarsky, Katja %A Rott, Gunnar Andreas %A Gustin, Wolfgang %A Reisinger, Hans %D 2018 %J Microelectron. Reliab. %K dblp %P 1-10 %T NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. %U http://dblp.uni-trier.de/db/journals/mr/mr82.html#SchlunderPRGR18 %V 82

@article{journals/mr/SchlunderPRGR18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Schlünder, Christian and Puschkarsky, Katja and Rott, Gunnar Andreas and Gustin, Wolfgang and Reisinger, Hans}, biburl = {https://www.bibsonomy.org/bibtex/2a0fe8cbbfb8c6f5b4b4c3b166cf28057/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.12.043}, interhash = {2376859134f6d1866ee6130d5a4aa614}, intrahash = {a0fe8cbbfb8c6f5b4b4c3b166cf28057}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {1-10}, timestamp = {2020-02-25T13:27:39.000+0100}, title = {NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr82.html#SchlunderPRGR18}, volume = 82, year = 2018 }