%0 Conference Paper %1 conf/vts/AlampallyVSPA11 %A Alampally, Srinivasulu %A Venkatesh, R. T. %A Shanmugasundaram, Priyadharshini %A Parekhji, Rubin A. %A Agrawal, Vishwani D. %B VTS %D 2011 %I IEEE Computer Society %K dblp %P 285-290 %T An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. %U http://dblp.uni-trier.de/db/conf/vts/vts2011.html#AlampallyVSPA11 %@ 978-1-61284-657-6

@inproceedings{conf/vts/AlampallyVSPA11, added-at = {2018-12-05T00:00:00.000+0100}, author = {Alampally, Srinivasulu and Venkatesh, R. T. and Shanmugasundaram, Priyadharshini and Parekhji, Rubin A. and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/21e368dea6e45716a7173f88f1bc5a209/dblp}, booktitle = {VTS}, crossref = {conf/vts/2011}, ee = {https://doi.org/10.1109/VTS.2011.5783735}, interhash = {246ecfd7dd79a7bc2551eb1d8679e7b0}, intrahash = {1e368dea6e45716a7173f88f1bc5a209}, isbn = {978-1-61284-657-6}, keywords = {dblp}, pages = {285-290}, publisher = {IEEE Computer Society}, timestamp = {2018-12-06T11:40:09.000+0100}, title = {An efficient test data reduction technique through dynamic pattern mixing across multiple fault models.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2011.html#AlampallyVSPA11}, year = 2011 }