%0 Conference Paper %1 conf/itc/OberleM91 %A Oberle, H.-D. %A Muhmenthaler, Peter %B ITC %D 1991 %I IEEE Computer Society %K dblp %P 548-555 %T Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM. %U http://dblp.uni-trier.de/db/conf/itc/itc1991.html#OberleM91 %@ 0-8186-9156-5

@inproceedings{conf/itc/OberleM91, added-at = {2017-05-24T00:00:00.000+0200}, author = {Oberle, H.-D. and Muhmenthaler, Peter}, biburl = {https://www.bibsonomy.org/bibtex/2db4986e9d3f0e165bec70e4000eec5cb/dblp}, booktitle = {ITC}, crossref = {conf/itc/1991}, ee = {https://doi.org/10.1109/TEST.1991.519717}, interhash = {25aa7bf7053cf13929d29dc9c3cb4166}, intrahash = {db4986e9d3f0e165bec70e4000eec5cb}, isbn = {0-8186-9156-5}, keywords = {dblp}, pages = {548-555}, publisher = {IEEE Computer Society}, timestamp = {2019-02-14T11:45:59.000+0100}, title = {Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1991.html#OberleM91}, year = 1991 }