Inproceedings,
Adapting an industrial memory BIST solution for testing CAMs.
J. Abraham, U. Garg, G. Colón-Bonet, R. Sharma, C. Di, B. Nadeau-Dostie, E. Racine, and M. Keim.ITC-Asia, page 112-117. IEEE, (2017)
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- conf/itc-asia/AbrahamGCSDNRK17
- entry type
- inproceedings
- booktitle
- ITC-Asia
- year
- 2017
- pages
- 112-117
- publisher
- IEEE
- crossref
- conf/itc-asia/2017
- ee
- https://doi.org/10.1109/ITC-ASIA.2017.8097123
- isbn
- 978-1-5386-3051-8
- url
- http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#AbrahamGCSDNRK17
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%1 conf/itc-asia/AbrahamGCSDNRK17
%A Abraham, Jais
%A Garg, Uttam
%A Colón-Bonet, Glenn
%A Sharma, Ramesh
%A Di, Chennian
%A Nadeau-Dostie, Benoit
%A Racine, Etienne
%A Keim, Martin
%B ITC-Asia
%D 2017
%I IEEE
%K dblp
%P 112-117
%T Adapting an industrial memory BIST solution for testing CAMs.
%U http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#AbrahamGCSDNRK17
%@ 978-1-5386-3051-8
@inproceedings{conf/itc-asia/AbrahamGCSDNRK17,
added-at = {2019-11-13T00:00:00.000+0100},
author = {Abraham, Jais and Garg, Uttam and Colón-Bonet, Glenn and Sharma, Ramesh and Di, Chennian and Nadeau-Dostie, Benoit and Racine, Etienne and Keim, Martin},
biburl = {https://www.bibsonomy.org/bibtex/2c5edfe4bcd71a90c70b4ec70c84eead1/dblp},
booktitle = {ITC-Asia},
crossref = {conf/itc-asia/2017},
ee = {https://doi.org/10.1109/ITC-ASIA.2017.8097123},
interhash = {25c6db2e9f98d3202df85315d0c91515},
intrahash = {c5edfe4bcd71a90c70b4ec70c84eead1},
isbn = {978-1-5386-3051-8},
keywords = {dblp},
pages = {112-117},
publisher = {IEEE},
timestamp = {2024-04-09T21:38:03.000+0200},
title = {Adapting an industrial memory BIST solution for testing CAMs.},
url = {http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#AbrahamGCSDNRK17},
year = 2017
}