%0 Conference Paper %1 conf/vlsit/KoPBJSKLJLLPKKJ23 %A Ko, S. %A Park, J. H. %A Bak, J. H. %A Jung, H. %A Shim, J. %A Kim, D. S. %A Lim, W. %A Jeong, D.-E. %A Lee, J. H. %A Lee, K. %A Park, J.-H. %A Kim, Y. %A Kim, C. %A Jeong, J. H. %A Lee, C. Y. %A Han, S. H. %A Ji, Y. %A Hwang, S. H. %A Shin, H. J. %A Lee, K. %A Song, Y. J. %A Shin, Y. G. %A Song, J. H. %B VLSI Technology and Circuits %D 2023 %I IEEE %K dblp %P 1-2 %T Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node. %U http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#KoPBJSKLJLLPKKJ23 %@ 978-4-86348-806-9

@inproceedings{conf/vlsit/KoPBJSKLJLLPKKJ23, added-at = {2023-07-28T00:00:00.000+0200}, author = {Ko, S. and Park, J. H. and Bak, J. H. and Jung, H. and Shim, J. and Kim, D. S. and Lim, W. and Jeong, D.-E. and Lee, J. H. and Lee, K. and Park, J.-H. and Kim, Y. and Kim, C. and Jeong, J. H. and Lee, C. Y. and Han, S. H. and Ji, Y. and Hwang, S. H. and Shin, H. J. and Lee, K. and Song, Y. J. and Shin, Y. G. and Song, J. H.}, biburl = {https://www.bibsonomy.org/bibtex/2b1b51f974abc0a9c8114b717860dbfa8/dblp}, booktitle = {VLSI Technology and Circuits}, crossref = {conf/vlsit/2023}, ee = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185248}, interhash = {25e339ffb0859cf3a18941f404969a80}, intrahash = {b1b51f974abc0a9c8114b717860dbfa8}, isbn = {978-4-86348-806-9}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T19:13:01.000+0200}, title = {Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node.}, url = {http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#KoPBJSKLJLLPKKJ23}, year = 2023 }