%0 Journal Article %1 journals/mr/IvoCKSLZMWTGB14 %A Ivo, Ponky %A Cho, Eunjung Melanie %A Kotara, Przemyslaw %A Schellhase, Lars %A Lossy, Richard %A Zeimer, Ute %A Mogilatenko, Anna %A Würfl, Joachim %A Tränkle, Günther %A Glowacki, Arkadiusz %A Boit, Christian %D 2014 %J Microelectron. Reliab. %K dblp %N 6-7 %P 1288-1292 %T New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#IvoCKSLZMWTGB14 %V 54

@article{journals/mr/IvoCKSLZMWTGB14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Ivo, Ponky and Cho, Eunjung Melanie and Kotara, Przemyslaw and Schellhase, Lars and Lossy, Richard and Zeimer, Ute and Mogilatenko, Anna and Würfl, Joachim and Tränkle, Günther and Glowacki, Arkadiusz and Boit, Christian}, biburl = {https://www.bibsonomy.org/bibtex/2bb6be534daf289c200ae562e91b7b1e1/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.03.005}, interhash = {25e3af5fcfb0cd2a1ed0bd33ff6f8c1c}, intrahash = {bb6be534daf289c200ae562e91b7b1e1}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {6-7}, pages = {1288-1292}, timestamp = {2020-02-25T13:25:01.000+0100}, title = {New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#IvoCKSLZMWTGB14}, volume = 54, year = 2014 }