%0 Journal Article %1 journals/mr/Bahat-TreidelHT16 %A Bahat-Treidel, Eldad %A Hilt, Oliver %A Treidel, O. Bahat %A Würfl, Joachim %D 2016 %J Microelectron. Reliab. %K dblp %P 556-559 %T Temperature dependent dynamic on-state resistance in GaN-on-Si based normally-off HFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#Bahat-TreidelHT16 %V 64

@article{journals/mr/Bahat-TreidelHT16, added-at = {2021-10-14T00:00:00.000+0200}, author = {Bahat-Treidel, Eldad and Hilt, Oliver and Treidel, O. Bahat and Würfl, Joachim}, biburl = {https://www.bibsonomy.org/bibtex/2c0caf16ed92e566830317c9c65cfb4ec/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.077}, interhash = {27aa643484d0fff228066f541a28ea4a}, intrahash = {c0caf16ed92e566830317c9c65cfb4ec}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {556-559}, timestamp = {2024-04-09T02:50:13.000+0200}, title = {Temperature dependent dynamic on-state resistance in GaN-on-Si based normally-off HFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#Bahat-TreidelHT16}, volume = 64, year = 2016 }